UM MUSE Carnot Chimie Balard Cirimat Pole Balard

Supervisory authorities

ENSCM CNRS UM

Search




Home > Services

X-ray diffraction and reflectometry

Person in charge :

Arie VAN DER LEE

Phone: +33 4 67 14 91 35

E-mail : arie.van-der-lee@umontpellier.fr

Services :

-X-ray reflectometry :

  • analysis of density/thickness/roughness of thin films

-X-ray diffraction on powders/single crystals/thin films

  • Crystalline phase identification
  • Atomic structure determination of a crystalline phase
  • Measurements under pression/stress/high and low temperatures/ultra-violet irradiation

Equipments

Gemini-S (Agilent Technologies)

Gemini-S (Agilent Technologie)
Single-crystal diffractometer
 

Bruker D5000

Powder and thin film diffractometer/ Reflectometry at ambient conditions or under controlled atmosphere.
 

X'pert Pro (Pan Analytical)

X’pert Pro (Pan Analytical)
Powder diffractometer for phase identification and quantitative Rietveld analysis.